Ntegra Marlin

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Defense Industry - Security

Sensitive Tools and Products

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Ntegra Marlin;

AFMSICMRaman triple synergy of powerful nanocharacterization techniques Hopping mode ion conductance microscopy noncontact imaging of living cells and jelly surfaces QNM power of AFM and SICM quantitative nanomechanical studies Smart Patch Clamp automatic nanopipette targeting for ion channel studies HighSpeed LongRange HighResolution mapping at nanoscale Nanoinjection nanopipettes with SICM feedback control can be used for local subpicoliter injections to single cells SICM (Scanning Ion Conductance Microscopy) is an SPM technique which uses nanopipette (sharp glass electrode) for noncontact 3D surface mapping at high resolution. In SICM, the probe to sample distance is controlled via the decrease of ionic current flowing through the tip, as it approaches the sample surface. Biophys.Journ. 73, 653658

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